K Cho, R Kobayashi, T Fukuoka, J Y Oh, H Yasuda, M Todai, T Nakano, A Ikeda, M Ueda, M Takeyama,
Microstructure and Fatigue Properties of TiAl with Unique Layered Microstructure Fabricated by Electron Beam Melting
Materials Science Forum, 941 (2018) 1597-1602.
dx.doi.org/10.4028/www.scientific.net/MSF.941.1597